Papers 1 페이지 | 성균관대학교 품질공학연구실 홈페이지

Total 69건 1 페이지

Publications

KNST(The Korean Society for Naval Science and Technology)

A Study on the Applicability of Naval Maintenance Systems for the Adoption of Digital Twin-based Predictive Maintenance

Engineering Failure Analysis

Improving quality and reliability of disposable desiccant to prevent condensation in automotive headlamps

대한산업공학회

품질 및 신뢰성 분야의 연구 동향, 산업체 적용과 발전 방향

Quality Engineering

MR-RF : A robust data mining method for multiresponse optimization using a random forest

Quality and Reliability Engineering International

Predicting remaining useful life and optimizing preventive maintenance for multistage manufacturing processes

Expert Systems With Applications

Development of a Suspiciousness Measure with Reduced Redundancy for Screening Machine Sets in Serial-Parallel Multistage Manufacturing Processes

Machines

Edge Computing-Based Digital Twin Framework Based on ISO 23247 for Enhancing Data Processing Capabilities

Computers in Industry

Enhanced Detection of Unknown Defect Patterns on Wafer Bin Maps Based on an Open-Set Recognition Approach

Expert Systems With Applications

A Framework for Detecting Unknown Defect Patterns on Wafer Bin Maps Using Active Learning

Computers & Industrial Engineering

Similarity searching for wafer bin maps by measuring shape, location, and size similarities of defect patterns

Materials & Design

Response to “Comments on Seo et al., Materials & Design 117 (2017) 131–138, DOI: 10.1016/j.matdes.2016.12.066”

International Journal of Advanced Manufacturing Technology

Prediction of spring steel wire rod hardness based on wire rod rolling process data: a case study

Advanced Engineering Informatics

Development of a Spatial Dimension-based Taxonomy for Classifying the Defect Patterns in a Wafer Bin Map

ICIEAEU '24: Proceedings of the 2024 11th International Conference on Industrial…

Path Score Based Approach for Deriving Machine Sequence in Multistage Process

ICIEAEU '24: Proceedings of the 2024 11th International Conference on Industrial…

A Multi Step Approach for Identifying Unknown Defect Patterns on Wafer Bin Map